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Introduction To Scanning Electron Microscopy

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Issue:

Science

 

Written by:

James R

 

Date added:

October 30, 2014

 

Level:

University

 

Grade:

A

 

No of pages / words:

13 / 3428

 

Was viewed:

6943 times

 

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Essay content:

Both the information is derived by changing the working distance, accelerating voltage, aperture size, probe current, resolution and magnification. AIM To analyse samples and obtain micrographs of the surface, using a scanning electron microscope. The experimental images are compared against the different material structures and defects between the various samples at different magnifications and resolutions...
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The instrument can be separated into three major sections including electron-optical ?column', vacuum system and electronics and display system. Figure 1: Layout off scanning Electron Microscope. In the optical part of instrument, the first thing we notice is the need for a source of illumination. No visible photons of light are produced within the SEM but an invisible beam of electrons...
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