L52 Nand Target Spec

Essay specific features

 

Issue:

Technology

 

Written by:

Corine M

 

Date added:

June 10, 2015

 

Level:

University

 

Grade:

A

 

No of pages / words:

104 / 28880

 

Was viewed:

8192 times

 

Rating of current essay:

 
Essay content:

| | | | |new/modifications to Inhibit scheme | | | | |BitLines to avoid in MiniArray when using MACurrCell | |4 |NATHAN |7/16/07 |Add Note to MONITOR Test Macro that ATUB voltage on monitor pad is limited to| | | | |VSG-Vt | | | | |Added option to OIVMON for v20reg_div | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | Table of Contents Revision Sheet 2 Table of Contents 2 List of Tables 2 List of Figures 2 1...
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Product Overview 2 Introduction 2 Critical Specs 2 Package Options 2 New features 2 2. Architecture 2 Summary 2 Figure 2-1 – L52 Simplified Floor Plan 2 Special Pads 2 LOW PIN COUNT Pads 2 MDS0, 1, 2 Pads 2 Mirror Pad 2 VSP (VWL) Pad 2 P_MONITOR Pad 2 Multi Die Logic 2 Array Overview 2 Address Topo 2 Block Diagram 2 Detailed Floor Plan 2 Row Decode 2 L52A Read Path 2 L52A Write Path 2 Dynamic Data Cache (DDC) Overview 2 DDC Circuit 2 SenseAmp – Read Timing 2 Sense Amp – Program Timing (stole some pictures from design review) 2 Program Verify without SSPC 2 Program verify with SSPC 2 Sense Amp - Erase Verify Timing 2 TEV/SPV/EV DDC Sequence 2 Algo Overview 2 READ LOWER PAGE 2 READ UPPER PAGE 2 Program concept of MLC NAND 2 PGM LOWER PAGE: 2 PGM UPPER PAGE 2 L52 Program Inhibit Selection by ROM Selection 2 Program Inhibit Schemes on L52 2 Vpgm_max Issue 2 Erase concept of MLC NAND 2 ERASE ALGO: 2 Erase Ramp Control 2 3...
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